Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

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@article{Gielen2008EmergingYA, title={Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies}, author={Georges G. E. Gielen and Peter H. N. De Wit and Elie Maricau and J. Loeckx and Javier Mart{\'i}n-Mart{\'i}nez and Ben Kaczer and Guido Groeseneken and Rosana Rodr{\'i}guez and Montserrat Nafr{\'i}a}, journal={2008 Design, Automation and Test in Europe}, year={2008}, pages={1322-1327} }