Embedded Tutorial: IC Test Cost Benchmarking

  • Klaus Luther
  • Published 2007 in 12th IEEE European Test Symposium (ETS'07)

Abstract

Driven by the increasing complexity of integrated circuits, the pressure on test cost reduction increases exponentially as productivity on chip level progresses according to Moore's Law. A high-level strategic approach for test cost target setting and planning will be explained. The intention is to keep cost of test constant relative to overall cost of… (More)
DOI: 10.1109/ETS.2007.23

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