Embedded Test Technology - Brief History, Current Status, and Future Directions

  • Janusz Rajski
  • Published 2005 in 14th Asian Test Symposium (ATS'05)


The conference theme of ITC 2005 focuses on evolutionary as well as revolutionary trends in test technology. It states: "Recent advances in areas such as on-chip compression, low-cost test, and data analysis have burst onto the scene and are being rapidly and widely adopted". Indeed, test compression is one of the fastest adopted DFT methodologies. It had… (More)
DOI: 10.1109/ATS.2005.56


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