Ellipsometric , Electrochemical , and Elemental Characterization of the Surface Phase Produced on Glassy Carbon Electrodes by Electrochemical Activation

Ellipsometry was used to monitor the In situ growth of a fllm on a glassy carbon electrode, whlch was electrochemlcally anodized at 1.8 V In 0.1 M H,SO,. The layer grew contlnuously In an uninhlblted fashion wlth constant optical constants to a thlckness of at least 925 nm. I t was nearly transparent at wavelengths of 545 and 632.8 nm. X-ray and elemental… CONTINUE READING