Ellipse fitting for interferometry. Part 1: static methods.

@article{Collett2014EllipseFF,
  title={Ellipse fitting for interferometry. Part 1: static methods.},
  author={M. J. Collett and Garry J. Tee},
  journal={Journal of the Optical Society of America. A, Optics, image science, and vision},
  year={2014},
  volume={31 12},
  pages={2573-83}
}
We compare a number of different methods for fitting an ellipse to a static set of measured data points, specifically considering their suitability for interferometric application. We suggest an improved distance approximation for least-square geometric fitting and alternative normalizations for linear algebraic fitting. Of the methods considered, an algebraic fit using a data-dependent normalization has both the least bias in phase and amplitude estimation and the greatest robustness against… CONTINUE READING

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