• Computer Science
  • Published 2011

Electronic device test system and test method

@inproceedings{2011ElectronicDT,
  title={Electronic device test system and test method},
  author={翁世芳 and 陆欣 and 刘耀华 and 许忠林},
  year={2011}
}
The present invention relates to an electronic device testing system and test method. The electronic device testing system includes a server and a client, the client and at least one electronic device under test is electrically connected to a remote server from the client for access to the electronic device to be tested in the test procedure, the test execution program and testing the electronic device under test, and the test results are shown in the client or server. 

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