Electron backscatter diffraction and photoluminescence of sputtered CdTe thin films

@article{Nowell2011ElectronBD,
  title={Electron backscatter diffraction and photoluminescence of sputtered CdTe thin films},
  author={Matthew M. Nowell and M. A. Scarpulla and A. D. Compaan and Xiangxin Liu and N. R. Paudel and Dohyoung Kwon and K. A. Wieland},
  journal={2011 37th IEEE Photovoltaic Specialists Conference},
  year={2011},
  pages={001327-001332}
}
Electron backscatter diffraction (EBSD) has been used to characterize the grain size, grain boundary structure, and texture of sputtered CdTe at varying deposition pressures before and after CdCl2 treatment in order to correlate performance with film microstructure. It is known that twin boundaries may have different electrical properties than high-angle… CONTINUE READING