Electron-Beam Manipulation of Silicon Dopants in Graphene

@article{Tripathi2018ElectronBeamMO,
  title={Electron-Beam Manipulation of Silicon Dopants in Graphene},
  author={Mukesh Tripathi and Andreas Mittelberger and Nicholas A. Pike and Clemens Mangler and Jannik C. Meyer and Matthieu Jean Verstraete and Jani Kotakoski and Toma Susi},
  journal={Nano Letters},
  year={2018},
  volume={18},
  pages={5319 - 5323}
}
The direct manipulation of individual atoms in materials using scanning probe microscopy has been a seminal achievement of nanotechnology. Recent advances in imaging resolution and sample stability have made scanning transmission electron microscopy a promising alternative for single-atom manipulation of covalently bound materials. Pioneering experiments using an atomically focused electron beam have demonstrated the directed movement of silicon atoms over a handful of sites within the graphene… 

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