Electron Back Scattered Diffraction : Current State , Prospects and Comparison with X-Ray Diffraction Texture Measurement

@inproceedings{Schwarzer2013ElectronBS,
  title={Electron Back Scattered Diffraction : Current State , Prospects and Comparison with X-Ray Diffraction Texture Measurement},
  author={Robert A. Schwarzer and Johann Sukkau},
  year={2013}
}
Within the past decade Electron Backscatter Diffrac tion (EBSD) has experienced wide acceptance in metallurgical and geological labs. It is a Kikuchi d ffraction device based on the SEM that enables individual grain orientations, local texture, point -to-point orientation correlations, and phases to b e determined routinely at a sub-grain size level on t he surfaces of bulk polycrystals while exploiting t he excellent imaging capabilities of the SEM. After a brief retrospective some aspects of… CONTINUE READING

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