Electromigration simulation with consideration of the atomic concentration gradient

@article{Chen2008ElectromigrationSW,
  title={Electromigration simulation with consideration of the atomic concentration gradient},
  author={Xuefan Chen and Lihua Liang and Yong Liu},
  journal={2008 International Conference on Electronic Packaging Technology & High Density Packaging},
  year={2008},
  pages={1-7}
}
An enhanced finite element modeling methodology based on commercial software ANSYS Multi-physics and FORTRAN code is developed for the simulation of electromigration. The electronic migration formulation taking into account the effects of the atomic concentration gradient (ACG) has been developed to show the difference in the electromigration (EM) failure… CONTINUE READING