Electrical property heterogeneity at transparent conductive oxide/organic semiconductor interfaces: mapping contact ohmicity using conducting-tip atomic force microscopy.

Abstract

We demonstrate mapping of electrical properties of heterojunctions of a molecular semiconductor (copper phthalocyanine, CuPc) and a transparent conducting oxide (indium-tin oxide, ITO), on 20-500 nm length scales, using a conductive-probe atomic force microscopy technique, scanning current spectroscopy (SCS). SCS maps are generated for CuPc/ITO… (More)
DOI: 10.1021/nn303043y

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@article{Macdonald2012ElectricalPH, title={Electrical property heterogeneity at transparent conductive oxide/organic semiconductor interfaces: mapping contact ohmicity using conducting-tip atomic force microscopy.}, author={G A Macdonald and P Alexander Veneman and Diogenes Placencia and Neal R. Armstrong}, journal={ACS nano}, year={2012}, volume={6 11}, pages={9623-36} }