Electrical characterization of analogue and RF integrated circuits by thermal measurements

Abstract

This paper presents a novel technique for measuring the electrical characteristics of analogue circuits, based on measuring the temperature at the silicon surface close to the circuit under test. As a detailed example, the paper analyses how the gain of an amplifier can be observed through temperature measurements. Experimental results validate the… (More)
DOI: 10.1016/j.mejo.2006.08.003

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Cite this paper

@article{Mateo2007ElectricalCO, title={Electrical characterization of analogue and RF integrated circuits by thermal measurements}, author={Diego Mateo and Josep Altet and Eduardo Aldrete-Vidrio}, journal={Microelectronics Journal}, year={2007}, volume={38}, pages={151-156} }