Electrical Resistance Tomography of Conductive Thin Films

@article{Cultrera2016ElectricalRT,
  title={Electrical Resistance Tomography of Conductive Thin Films},
  author={A. Cultrera and L. Callegaro},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2016},
  volume={65},
  pages={2101-2107}
}
  • A. Cultrera, L. Callegaro
  • Published 2016
  • Mathematics, Computer Science, Physics
  • IEEE Transactions on Instrumentation and Measurement
The electrical resistance tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution and local conductivity values are obtained. Test samples are tin-oxide films on glass substrates, with electrical contacts on the sample boundary. Some samples are deliberately patterned in order to induce null conductivity zones of known geometry, while others contain higher… Expand
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