Electric field distribution and the reduction of laser damage in multilayers.

@article{Arnon1980ElectricFD,
  title={Electric field distribution and the reduction of laser damage in multilayers.},
  author={O Arnon and Philip Baumeister},
  journal={Applied optics},
  year={1980},
  volume={19 11},
  pages={
          1853-5
        }
}
The characteristic matrix method is used to compute the electric field distribution in a multilayer. The use of optically inhomogeneous films is suggested to lessen discontinuity in the material properties and in the absorption distribution at interfaces between the high-index and the low-index layers, thereby enhancing the laser damage threshold.