Electric field and grain size dependence of Meyer–Neldel energy in C60 films

@inproceedings{Ullah2011ElectricFA,
  title={Electric field and grain size dependence of Meyer–Neldel energy in C60 films},
  author={Mujeeb Ullah and Almantas Pivrikas and I. I. Fishchuk and A. K. Kadashchuk and Philipp Stadler and Clemens Simbrunner and N. S. Sariciftci and H. Sitter},
  booktitle={Synthetic metals},
  year={2011}
}
Meyer-Neldel rule for charge carrier mobility measured in C(60)-based organic field-effect transistors (OFETs) at different applied source drain voltages and at different morphologies of semiconducting fullerene films was systematically studied. A decrease in the Meyer-Neldel energy E(MN) from 36 meV to 32 meV was observed with changing electric field in… CONTINUE READING