Efficient template generation for instruction-based self-test of processor cores

@article{Kambe2004EfficientTG,
  title={Efficient template generation for instruction-based self-test of processor cores},
  author={Kazuko Kambe and Michiko Inoue and Hideo Fujiwara},
  journal={13th Asian Test Symposium},
  year={2004},
  pages={152-157}
}
This paper presents a method of template generation for instruction-based self-test of processor cores. A test program template is an instruction sequence with unspecified operands, and represents paths for justification of test patterns and propagation of test responses for a module under test (MUT). In order to justify value of MUT inputs, we introduce a concept of adjacent registers of the MUT that makes it possible to consider input spaces of the MUT determined by signals from other modules… CONTINUE READING

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