Efficient techniques for gate leakage estimation

Abstract

Gate leakage current is expected to be the dominant leakage component in future technology generations. In this paper, we propose methods for steady-state gate leakage estimation based on state characterization. An efficient technique for pattern-dependent gate leakage estimation is presented. Further, we propose the use of this technique for estimating the… (More)
DOI: 10.1145/871506.871533

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