Efficient selection of critical paths for delay defects in the presence of process variations

@article{Alladi2016EfficientSO,
  title={Efficient selection of critical paths for delay defects in the presence of process variations},
  author={Phaninder Alladi and Spyros Tragoudas},
  journal={2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)},
  year={2016},
  pages={1-6}
}
This paper presents a method to select critical paths that target spot delay defects in the presence of process variations. The number of critical paths |C| selected are restricted to a test budget. The method uses heuristics that quickly identify the most critical path based on dynamic programming approach. The method considers the established linear… CONTINUE READING