Efficient positional misalignment correction method for Fourier ptychographic microscopy.


Fourier ptychographic microscopy (FPM) is a newly developed super-resolution technique, which employs angularly varying illuminations and a phase retrieval algorithm to surpass the diffraction limit of a low numerical aperture (NA) objective lens. In current FPM imaging platforms, accurate knowledge of LED matrix's position is critical to achieve good… (More)
DOI: 10.1364/BOE.7.001336