Efficient exact spare allocation via Boolean satisfiability

@article{Yu2005EfficientES,
  title={Efficient exact spare allocation via Boolean satisfiability},
  author={Fang Yu and Chung-Hung Tsai and Yao-Wen Huang and D. T. Lee and Hung-Yau Lin and Sy-Yen Kuo},
  journal={20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)},
  year={2005},
  pages={361-370}
}
Fabricating large memory and processor arrays is subject to physical failures resulting in yield degradation. The strategy of incorporating spare rows and columns to obtain reasonable production yields was first proposed in the 1970s, and continues to play an important role in recent VLSI developments. The spare allocation problem (SAP) in general is known to be intractable, an efficient exact spare allocation algorithm has great value. We propose a new Boolean encoding of SAP and a new SAT… CONTINUE READING

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References

Publications referenced by this paper.
Showing 1-10 of 41 references

Predicting Defect-Tolerant Yield in the Embedded Core Context

IEEE Trans. Computers • 2003
View 3 Excerpts
Highly Influenced

Probabilistic analysis and algorithms for reconfiguration of memory arrays

IEEE Trans. on CAD of Integrated Circuits and Systems • 1992
View 4 Excerpts
Highly Influenced

On the Repair of Redundant RAM's

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • 1987
View 5 Excerpts
Highly Influenced

A 0.13μm Triple-Vt 9MB Third Level On-Die Cache for the Itanium®

J. Shoemaker, M. Haque, +10 authors S. Rusu
Proceedings of the 2005 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems • 2005
View 1 Excerpt

An efficient perfect algorithm for memory repair problems

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. • 2004
View 6 Excerpts

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