Efficient Multi-site Testing Using ATE Channel Sharing

@inproceedings{Eom2013EfficientMT,
  title={Efficient Multi-site Testing Using ATE Channel Sharing},
  author={Kyoung Woon Eom and Dong Han and Yong Lee and Hak Song Kim and Sungho Kang},
  year={2013}
}
Multi-site testing is considered as a solution to reduce test costs. This paper presents a new channel sharing architecture that enables I/O pins to share automatic test equipment (ATE) channels using simple circuitry such as tri-state buffers, AND gates, and multiple-input signature registers (MISR). The main advantage of the proposed architecture is that it is implemented on probe cards and does not require any additional circuitry on a target device under test (DUT). In addition, the… CONTINUE READING

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Key Quantitative Results

  • The proposed architecture demonstrates a more than 40% reduction in test time compared with the traditional multi-site test architecture, whereas there is not a large difference in test time between the traditional multi-site test and the stimuli broadcasting method.

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