Efficient Generation of Test Patterns Using Boolean Difference

@inproceedings{Larrabee1989EfficientGO,
  title={Efficient Generation of Test Patterns Using Boolean Difference},
  author={Tracy Larrabee},
  booktitle={ITC},
  year={1989}
}
A combinational circuit can be tested for the presence of a single stuck-at fault by applying a set of inputs that excite a verifiable output response in that circuit. If the fault is present, the output will be different than it would be if the fault were not present. Given a circuit, the goal of an automatic test pattern generation system is to generate a set of input sets that will detect every possible single stuck-at fault in the circuit. These two papers describe a new method for… CONTINUE READING
Highly Influential
This paper has highly influenced 11 other papers. REVIEW HIGHLY INFLUENTIAL CITATIONS
Highly Cited
This paper has 97 citations. REVIEW CITATIONS
53 Extracted Citations
4 Extracted References
Similar Papers

Citing Papers

Publications influenced by this paper.
Showing 1-10 of 53 extracted citations

97 Citations

0510'90'95'01'07'13
Citations per Year
Semantic Scholar estimates that this publication has 97 citations based on the available data.

See our FAQ for additional information.

Referenced Papers

Publications referenced by this paper.
Showing 1-4 of 4 references

Fault Simulation for Structured VLSI

  • F. Brglez, H. Fujiwara, +39 authors T. Mc- Carthy
  • vol. VI, December 1985, 20-32.
  • 1985
2 Excerpts

The Complexity of Theorem Proving Procedures

  • T. Shirnono

Similar Papers

Loading similar papers…