This papers describes a new, fast and economical methodology totest linear analog circuits based on adaptive algorithms. To theauthors knowledge, this is the first time such technique is used totest analog circuits, allowing complete fault coverage. The paperpresents experimental results showing easy detection of soft,large-deviation and hard faults, with low cost instrumentation.Components variations from 5% to 1% have been detected, asthe comparison parameter (output error power) varied from300% to 20%.
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