Effects of reactive oxygen species on single polycation layers.

Abstract

Positively charged, branched polyethylenimine (PEI) adsorbed onto silicon wafers and silica surfaces are attacked by free hydroxyl radicals. With AFM colloid probe technique, the surface forces between PEI layers are measured. Force profiles show that an electrostatic repulsion dominates the surface forces between freshly deposited PEI layers. After radical… (More)
DOI: 10.1021/jp3127048

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