Effects of electromagnetic near-field stress on SiGe HBT's reliability

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@article{Alaeddine2009EffectsOE, title={Effects of electromagnetic near-field stress on SiGe HBT's reliability}, author={A. Alaeddine and M. Kadi and K. Daoud and B. Mazari}, journal={Microelectronics Reliability}, year={2009}, volume={49}, pages={1029-1032} }