Effects of as-deposited CdTe microstructure on solar cell performance

Abstract

In this study, two series of CdTe thin films were prepared by magnetron sputtering and analyzed in-situ using real time spectroscopic ellipsometry (RTSE). One series consists of CdTe thin films deposited at substrate temperatures ranging from 188°C to 304°C at a fixed Ar sputtering pressure of 18 mTorr, and the other consists of films… (More)

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