Effective passivation of exfoliated black phosphorus transistors against ambient degradation.

@article{Wood2014EffectivePO,
  title={Effective passivation of exfoliated black phosphorus transistors against ambient degradation.},
  author={Joshua D. Wood and Spencer A. Wells and Deep Jariwala and Kan Sheng Chen and Eunkyung Cho and Vinod K. Sangwan and Xiaolong Liu and Lincoln J. Lauhon and Tobin J. Marks and Mark C. Hersam},
  journal={Nano letters},
  year={2014},
  volume={14 12},
  pages={
          6964-70
        }
}
Unencapsulated, exfoliated black phosphorus (BP) flakes are found to chemically degrade upon exposure to ambient conditions. Atomic force microscopy, electrostatic force microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy, and Fourier transform infrared spectroscopy are employed to characterize the structure and chemistry of the degradation process, suggesting that O2 saturated H2O irreversibly reacts with BP to form oxidized phosphorus species. This interpretation is… Expand
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