Effect of surface roughness on angle-resolved XPS: Effect of surface roughness on AR-XPS spectra

@inproceedings{Katona2012EffectOS,
  title={Effect of surface roughness on angle-resolved XPS: Effect of surface roughness on AR-XPS spectra},
  author={Laszlo Katona and Davide Bianchi and Josef Brenner and Georg Vorlaufer and Andr{\'a}s Vernes and Gerhard Betz and Wolfgang S. M. Werner},
  year={2012}
}
In the present contribution, the strategy of atomic force microscope mapping of periodical rough surfaces is combined with an extension of the polyhedral model. Atomic force microscope images are numerically interpolated, applying non-uniform rational B-splines, which also have the advantage that simultaneously to the interpolation, they provide the normals at any point on the rough surfaces. Compared with the polyhedral model, in the present scheme, any rough surface is accurately well… CONTINUE READING