Effect of subgrain boundaries on the producibility of detector arrays fabricated on traveling heater method (THM) materials

@inproceedings{Juravel1994EffectOS,
  title={Effect of subgrain boundaries on the producibility of detector arrays fabricated on traveling heater method (THM) materials},
  author={Yehuda Juravel and Avishai Kepten and Abraham A. Fraenkel and Eliezer Weiss and A I Marcus and Noam Amir and Yuri L. Hanin},
  booktitle={Defense, Security, and Sensing},
  year={1994}
}
The traveling heater method (THM) is usually characterized by crystal defects such as grain boundaries and dislocations. The need for low cost HgCdTe FPA systems requires high photodiode yield. This demands understanding the crystal defect-diode relationships and necessitates a sorting method that is able to sort the as grown THM wafers before process according to the probability of achieving large photodiode arrays. This paper discusses the influence of crystals defects on photodiode… CONTINUE READING

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