Effect of a Biased Probe on the Afterglow Operation of an ECR4 Ion Source

@article{Hill2000EffectOA,
  title={Effect of a Biased Probe on the Afterglow Operation of an ECR4 Ion Source},
  author={C. E. Hill and D K{\"u}chler and Fredrik Wenander and B. H. Wolf},
  journal={Review of Scientific Instruments},
  year={2000},
  volume={71},
  pages={863-865}
}
Various experiments have been performed on a 14.5 GHz ECR4 in order to improve the ion yield. The source runs in pulsed afterglow mode, and provides currents ∼120 eμA of Pb27+ to the CERN Heavy Ion Facility on an operational basis. In the search for higher beam intensities, the effects of a pulsed biased disk on axis at the injection side were investigated with different pulse timing and voltage settings. No proof for absolute higher intensities was seen for any of these modifications. However… Expand
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