Effect of Voltage Fluctuations on the Single Event Transient Response of Deep Submicron Digital Circuits

@article{Gadlage2007EffectOV,
  title={Effect of Voltage Fluctuations on the Single Event Transient Response of Deep Submicron Digital Circuits},
  author={M. J. Gadlage and R. D. Schrimpf and Balaji Narasimham and B. L. Bhuva and P. H. Eaton and J. Benedetto},
  journal={IEEE Transactions on Nuclear Science},
  year={2007},
  volume={54},
  pages={2495-2499}
}
Heavy ion-induced single events transients (SETs) in advanced digital circuits are becoming a significant reliability issue for space-based systems. In this work, two experiments are performed on devices designed to look specifically at digital single event transients. Small voltage variations, like those that can be found across an integrated circuit, are shown to affect the digital single event transient response significantly. For technologies with supply voltages near 1 V, these potential… CONTINUE READING
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