Effect of Roughness as Determined by Atomic Force Microscopy on the Wetting Properties of PTFE Thin Films *

@inproceedings{Miller2002EffectOR,
  title={Effect of Roughness as Determined by Atomic Force Microscopy on the Wetting Properties of PTFE Thin Films *},
  author={J. David Miller and S. VEERAMASUNENI and Jaroslaw W. Drelich and Madhuri Yalamanchili},
  year={2002}
}
The influence of film roughness on the wetting properties of vacuum-deposited polytetrafluroethylene (PTFE) thin films has been investigated using atomic force microscopy (AFM) and contact angle goniometry. Surface roughness has been characterized by atomic force microscopy in terms of RMS roughness (Rq) and fractal dimensions. A contact angle correlation with surface roughness, as determined by AFM, is evident from these results, which are discussed on the basis of wetting theory. The results… CONTINUE READING

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