Effect of Noise on Analog Circuit Testing

Abstract

The e ect of test environment noise (tester noise) on test waveforms is considered. Methods such as retro tting of analog test equipment or performing multiple fast fourier transforms (FFTs) on measured waveforms for repeatability and noise suppression are costly. We propose a simulation environment in which the tester noise characteristics along with wide… (More)
DOI: 10.1109/VTEST.1998.670861

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