Effect of Mn Interface Doping in Polycrystalline Exchange Bias Thin Films

Abstract

We report on the effect of 0-5 monoatomic layers of Mn deposited at the interface of a CoFe/IrMn polycrystalline thin film. All samples were produced via sputtering. Thermal activation measurements were carried out using the well-established York Protocols. In conjunction with grain size analysis performed on each sample the value of the antiferromagnet (AF… (More)

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