Effect of Driver Width Variations on Propagation Delay of Driver-Interconnect-Load System

Abstract

The performance of VLSI/ULSI chip is becoming less predictable as device dimensions shrinks below the sub-100-nm scale. Process variation is considered to be a major concern in the design of circuits including interconnect pipelines in current deep submicron regime. Process variation results in uncertainties of circuit performances such as propagation delay… (More)

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