Effect of DC Bias Field on the Time-of-Flight Current Waveforms of CdTe and CdZnTe Detectors

Abstract

The effect of a DC bias field on the time-of-flight current waveforms of electron and hole drift in CdTe and CdZnTe is reported. Under a DC bias, the electron waveforms show more rapid decay than under a pulsed bias, whereas the hole waveforms evolve with time. Qualitatively similar behavior is observed in both CdTe and CdZnTe. Monte Carlo simulations of… (More)

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Cite this paper

@article{Suzuki2011EffectOD, title={Effect of DC Bias Field on the Time-of-Flight Current Waveforms of CdTe and CdZnTe Detectors}, author={K. Suzuki and T. Sawada and Kohzoh Imai}, journal={IEEE Transactions on Nuclear Science}, year={2011}, volume={58}, pages={1958-1963} }