Economic Aspects of Memory Built-in Self-Repair

@article{Huang2007EconomicAO,
  title={Economic Aspects of Memory Built-in Self-Repair},
  author={Rei-Fu Huang and Chao-Hsun Chen and Cheng-Wen Wu},
  journal={IEEE Design & Test of Computers},
  year={2007},
  volume={24}
}
With the advent of deep-submicron technology and SoC design methodology, it's possible to integrate heterogeneous cores from different sources in a single chip containing millions of gates. The yield of such a large chip is usually too low to be profitable. Therefore, yield enhancement is an important issue in SoC product development. Memory cores usually… CONTINUE READING