Economic Analysis of the HOY Wireless Test Methodology

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@article{Hsing2010EconomicAO, title={Economic Analysis of the HOY Wireless Test Methodology}, author={Yu-Tsao Hsing and Li-Ming Denq and Chao-Hsun Chen and Cheng-Wen Wu}, journal={IEEE Design & Test of Computers}, year={2010}, volume={27}, pages={20-30} }