Easy and direct method for calibrating atomic force microscopy lateral force measurements.

@article{Liu2007EasyAD,
  title={Easy and direct method for calibrating atomic force microscopy lateral force measurements.},
  author={Wenhua Liu and Keith Bonin and Martin Guthold},
  journal={The Review of scientific instruments},
  year={2007},
  volume={78 6},
  pages={063707}
}
We have designed and tested a new, inexpensive, easy-to-make and easy-to-use calibration standard for atomic force microscopy (AFM) lateral force measurements. This new standard simply consists of a small glass fiber of known dimensions and Young's modulus, which is fixed at one end to a substrate and which can be bent laterally with the AFM tip at the other end. This standard has equal or less error than the commonly used method of using beam mechanics to determine a cantilever's lateral force… CONTINUE READING