EXM Eigen Templates for Detecting and Classifying Arbitrary Junctions


A novel method for extracting parametric junction and corner features in images is presented. By treating each complex feature as a combination of elementary line and edge features, the method provides an efficient way to locate features of interest with reduced number of filtering operations. The Expansion Matching (EXM) method is used to design optimal… (More)
DOI: 10.1109/ICIP.1998.723459


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