EMC immunity of integrated smart power transistors in a non-50Ω environment

@article{Nzalli2013EMCIO,
  title={EMC immunity of integrated smart power transistors in a non-50Ω environment},
  author={Hermann Nzalli and Wolfgang Wilkening and Rolf H. Jansen},
  journal={2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)},
  year={2013},
  pages={214-219}
}
The Direct Power Injection (DPI) standard, widely used for the susceptibility analysis of integrated circuits (IC), specifies an ideal 50Ω-environment for the investigations. This constant load assumption does not fully cover latter stages or the IC final operating environment, where ICs are subjected to various load impedances, especially at pins which are connected to wiring harnesses. We present variable-load DPI measurements and large-signal simulations for new circuit blocks, namely a… CONTINUE READING