Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM

@article{Fainstein2012DynamicIC,
  title={Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM},
  author={Daniel Fainstein and Sami Rosenblatt and Alberto Cestero and Norman Robson and Toshiaki Kirihata and Subramanian S. Iyer},
  journal={2012 Symposium on VLSI Circuits (VLSIC)},
  year={2012},
  pages={146-147}
}
A random intrinsic chip ID method generates a pair of 4Kb binary strings using retention fails in 32nm SOI embedded DRAM. Hardware results show ID overlap distance mean=0.58 and σ=0.76 and demonstrate 100% authentication for 346 chips. The analytical model predicts >; 99.999% unique IDs for 106 parts.