Dynamic electrothermal simulation of three-dimensional integrated circuits using standard cell macromodels

@article{Priyadarshi2012DynamicES,
  title={Dynamic electrothermal simulation of three-dimensional integrated circuits using standard cell macromodels},
  author={S. Priyadarshi and T. R. Harris and S. Melamed and Carlos Tadeo Ortega Otero and N. Kriplani and C. Christoffersen and R. Manohar and S. Dooley and W. Davis and P. Franzon and M. Steer},
  journal={IET Circuits Devices Syst.},
  year={2012},
  volume={6},
  pages={35-44}
}
Physics-based compact electrothermal macromodels of standard cells are developed for fast dynamic simulation of three-dimensional integrated circuits (3DICs). Such circuits can have high thermal densities and thermal effects often limit their performance. The macromodels developed here use fewer state-variables than a discrete transistor-level implementation while retaining transistor-level accuracy. This results in significant speed-up over transistor-level simulation for large-scale circuits… Expand
Thermal-Aware High-Frequency Characterization of Large-Scale Through-Silicon-Via Structures
  • Tianjian Lu, Jianming Jin
  • Materials Science
  • IEEE Transactions on Components, Packaging and Manufacturing Technology
  • 2014
Microprocessor Frequency Control Method Under Thermal and Energy Savings Constraints
  • M. Frankiewicz, A. Kos
  • Engineering
  • IEEE Transactions on Components, Packaging and Manufacturing Technology
  • 2015
Parallel Transient Simulation of Multiphysics Circuits Using Delay-Based Partitioning
Pathfinder3D: A framework for exploring early thermal tradeoffs in 3DIC
Thermal Pathfinding for 3-D ICs
Pathfinder 3D: A flow for system-level design space exploration
Asynchronous Design For Ubiquitous Computing

References

SHOWING 1-10 OF 33 REFERENCES
A Transient Electrothermal Analysis of Three-Dimensional Integrated Circuits
Realistic and efficient simulation of electro-thermal effects in VLSI circuits
Electrothermal simulation of integrated circuits
Electro-thermal circuit simulation using simulator coupling
Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices
Fully coupled dynamic electro-thermal simulation
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips
...
1
2
3
4
...