Dynamic critical exponent of two-, three-, and four-dimensional XY models with relaxational and resistively shunted junction dynamics

@article{Jensen2000DynamicCE,
  title={Dynamic critical exponent of two-, three-, and four-dimensional XY models with relaxational and resistively shunted junction dynamics},
  author={L. M. Jensen and B. Kim and P. Minnhagen},
  journal={Physical Review B},
  year={2000},
  volume={61},
  pages={15412-15428}
}
  • L. M. Jensen, B. Kim, P. Minnhagen
  • Published 2000
  • Physics
  • Physical Review B
  • The dynamic critical exponent $z$ is determined numerically for the $d$-dimensional XY model ($d=2, 3$, and 4) subject to relaxational dynamics and resistively shunted junction dynamics. We investigate both the equilibrium fluctuation and the relaxation behavior from nonequilibrium towards equilibrium, using the finite-size scaling method. The resulting values of $z$ are shown to depend on the boundary conditions used, the periodic boundary condition, and fluctuating twist boundary condition… CONTINUE READING
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