Dynamic SDRAM SEFI detection and recovery test results

  title={Dynamic SDRAM SEFI detection and recovery test results},
  author={S. M. Guertin and J. Patterson and D. N. Nguyen},
  journal={2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)},
Single event functionality interrupt (SEFI) results are presented for Hynix SDRAMS. The SEFI response threshold is below LET 9.9 Mev-cm/sup 2//mg and the saturated cross section is 6/spl times/10/sup -5/cm/sup 2/. Dynamic SEFI identification was made, and in-situ recovery restored functionality. Verification results of the identification algorithm are… CONTINUE READING