Dynamic ISD scheme for the AVM system - a preliminary study


Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original… (More)
DOI: 10.1109/ICRA.2015.7139469


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@article{Hsieh2015DynamicIS, title={Dynamic ISD scheme for the AVM system - a preliminary study}, author={Yao-Sheng Hsieh and Fan-Tien Cheng and Chun-Fang Chen and Jhao-Rong Lyu and Ting-Yu Lin}, journal={2015 IEEE International Conference on Robotics and Automation (ICRA)}, year={2015}, pages={2060-2065} }