Dynamic Compaction in SAT-Based ATPG

@article{Czutro2009DynamicCI,
  title={Dynamic Compaction in SAT-Based ATPG},
  author={Alexander Czutro and Ilia Polian and Piet Engelke and Sudhakar M. Reddy and Bernd Becker},
  journal={2009 Asian Test Symposium},
  year={2009},
  pages={187-190}
}
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compaction procedure for SAT-based ATPG which utilizes internal data structures of the SAT solver to extract essential fault detection conditions and to generate patterns which cover multiple faults. We complement this technique by a state-of-the-art forward-looking reverse-order simulation procedure. Experimental results… CONTINUE READING

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Key Quantitative Results

  • Experimental results obtained for an industrial benchmark circuit suite show that the new method outperforms earlier static approaches by approximately 23%.

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