Dual-Purpose Mixed-Level Test Generation Using Swarm Intelligence

  title={Dual-Purpose Mixed-Level Test Generation Using Swarm Intelligence},
  author={Kelson Gent and Michael S. Hsiao},
  journal={2014 IEEE 23rd Asian Test Symposium},
Automatic test pattern generation for non-scan sequential circuits is an extremely challenging task. If successful, it can offer many benefits to the EDA community, ranging from manufacturing and functional test to post-silicon validation. High-level test generators often miss the low-level details, thus missing the detection of some gate-level faults. On the other hand, gate-level test generators miss the high-level path traversal knowledge to more effectively traverse the state space. In this… CONTINUE READING
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