Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode

@article{Lapshin2019DriftinsensitiveDC,
  title={Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode},
  author={Rostislav V. Lapshin},
  journal={Applied Surface Science},
  year={2019}
}
  • R. Lapshin
  • Published 23 January 2015
  • Physics
  • Applied Surface Science
6 Citations

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References

SHOWING 1-10 OF 27 REFERENCES

Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope elimination

Drift, slope of sample, and indeterminate sensitivity of piezoceramics are considered as the origin of the linear scanning tunneling microscope (STM) image distortions. A special algorithm of STM

Simplified drift characterization in scanning probe microscopes using a simple two-point method

A very simple and rapid method of drift evaluation, by monitoring two points in the field of view, is proposed. This method can be used by all analysts and requires no special sample or software

Thermal drift study on different commercial scanning probe microscopes during the initial warming-up phase

Scanning probe microscopy (SPM) allows surface topography imaging with the highest resolution, as a result of accurate actuation combined with the sharpness of tips. The scanning process is

Modeling the hysteresis of a scanning probe microscope

Most scanning probe microscopes use piezoelectric actuators in open loop configurations. Therefore a major problem related to these instruments is the image distortion due to the hysteresis effect of

A simple method for preparing calibration standards for the three working axes of scanning probe microscope piezo scanners

A method for preparing samples suitable for calibrating scanning probe microscopes (SPM) and for eliminating any distortions in images is described. Samples consist of polystyrene particles organized

Drift elimination in the calibration of scanning probe microscopes

Calibration of scanning probe microscopes (SPM) for atomic (molecular) resolution scans can be carried out on crystalline surfaces. However, SPM scans with atomic resolution are often affected by

Automatic lateral calibration of tunneling microscope scanners

A practical method is described to find automatically the calibration coefficients and residual nonorthogonality of a tunneling microscope scanner. As initial data, the coordinates of three atoms

Feature-oriented scanning methodology for probe microscopy and nanotechnology

TLDR
Aal-time scanning algorithm is suggested which uses features of the surface as reference points at relative movements which allows one to exclude the negative influence of thermodrift, creep, and hysteresis over the performance of a scanning probe microscope.