Drift estimation for single marker switching based imaging schemes.

  title={Drift estimation for single marker switching based imaging schemes.},
  author={Claudia Geisler and Thomas Hotz and Andreas Schoenle and Stefan W Hell and Axel Munk and Alexander Egner},
  journal={Optics express},
  volume={20 7},
In recent years, the diffraction barrier in fluorescence imaging has been broken and optical nanoscopes now routinely image with resolutions of down to 20 nm, an improvement of more than 10 fold. Because this allows imaging much smaller features and because all super-resolution approaches trade off speed for spatial resolution, mechanical instabilities of the microscopes become a limiting factor. Here, we propose a fully data-driven statistical registration method for drift detection and drift… CONTINUE READING

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